Atomic Force Microscopy-Based Electrical Characterization of Materials

This timely book introduces the fundamental measurement concepts of the rapidly evolving atomic force microscopy (AFM) techniques for electrical characterization (EFM). It describes experimental approaches and setups, as well as challenges to overcome, and it also provides a wide range of real-world examples illustrating the method. This comprehensive guide for EFM techniques and their applications is an excellent reference for those working on microscopy in different fields, making the methods more accessible to a wider audience and enabling readers to explore the numerous possibilities of electrical techniques as research tools.

Aceasta carte in timp util introduce conceptele fundamentale de masurare ale tehnicilor de microscopie a fortei atomice (AFM) in evolutie rapida pentru caracterizarea electrica (EFM). Descrie abordari si configurari experimentale, precum si provocari de depasit si ofera, de asemenea, o gama larga de exemple din lumea reala care ilustreaza metoda.