Ellipsometry of Functional Organic Surfaces and Films

This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces.

Aceasta carte ofera un studiu de ultima ora al investigatiilor elipsometrice ale filmelor si suprafetelor organice, de la aplicatii de laborator pana la sincrotron, cu un accent special pe utilizarea in situ in medii de procesare si la interfetele solid-lichid.