Contactless VLSI Measurement and Testing Techniques


Disponibilitate: LIVRARE IN 3-5 SAPTAMANI (produsul este livrat din Marea Britanie)
SKU:
9783319888194

669.99 RON
Okian.ro este o LIBRARIE online de carte in limba engleza.

CITESTE MAI MULT

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Descriere RO

The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing.