Progress in Nanoscale Characterization and Manipulation

It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy.

Acesta prezinta progresele recente in microscopie electronica de scanare, microscopie electronica de transmisie si microscopie cu ioni de heliu, inclusiv spectroscopie avansata, microscopie corectata sferic, imagistica cu ioni focalizati si microscopie in situ.