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Scanning Electron Microscopy and X-Ray Microanalysis

Autor: Ritchie, Nicholas W. M.; Newbury, Dale; Joy, David C.; Michael, Joseph; Goldstein, Joseph; Scott, John Henry

Disponibilitate: Livrare in 2-4 saptamani (nu se afla in stoc, dar poate fi adus de la furnizorii nostri in 2-4 saptamani)

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SKU:
9781493966745

541,99 RON
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AutorRitchie, Nicholas W. M.; Newbury, Dale; Joy, David C.; Michael, Joseph; Goldstein, Joseph; Scott, John Henry
EdituraSpringer-Verlag New York Inc.
Dimensiuni217 x 284 x 36
Data Publicarii02/07/2017
Editie4th ed. 2018
FormatHardback
Numar pagini550
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Recenzati:Scanning Electron Microscopy and X-Ray Microanalysis
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