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Offers an overview of applications for selected electron microscope techniques that have become widespread in their use for furthering our understanding of how materials behave. This work discusses topics including weak-beam techniques for problem solving, defect structures and dislocation interactions, and atomic level imaging applications.
EdituraTaylor & Francis Ltd
Dimensiuni162 x 241 x 18
Data Publicarii01/01/1999
FormatCartonata
Numar pagini208
Aceasta este o carte in limba engleza. Descrierea cartii (tradusa din engleza cu Google Translate) este in limba romana din motive legale.